Nanotechnology Now - Press Release: Jeff Andreson to Join Nanometrics as Chief Financial Officer

Home > Press > Jeff Andreson to Join Nanometrics as Chief Financial Officer

Abstract:
Nanometrics Incorporated (Nasdaq:NANO), a leading provider of advanced process control metrology and inspection systems, today announced that Jeffrey S. Andreson will join Nanometrics as its Chief Financial Officer (CFO), effective September 22, 2014.

Jeff Andreson to Join Nanometrics as Chief Financial Officer

Milpitas, CA | Posted on September 4th, 2014

Mr. Andreson, 53, brings to Nanometrics 30 years of finance experience in the capital equipment industry. Since 2007 he has served as the CFO of Intevac, Inc. (Nasdaq:IVAC), a leading supplier of capital equipment to the hard drive media industry and night vision products to the military market. Prior to Intevac, Mr. Andreson spent 12 years at Applied Materials, Inc. where he held positions such as Managing Director, Controller of the $2B Applied Global Services business, and Managing Director, Global Financial Planning and Analysis. Mr. Andreson earned his B.S., Finance at San Jose State University and his M.B.A. at Santa Clara University.

Commenting on Mr. Andreson's appointment, CEO Timothy Stultz said, "We are very pleased to have Jeff joining us as CFO. He brings strong financial leadership and a wealth of industry experience to the company, and is well-suited to lead the finance organization through this next phase of growth for Nanometrics. Today, our company has a stronger position with every one of the world's leading semiconductor manufacturers than at any time in our history. Having Jeff at Nanometrics, to both lead the finance organization as well as be a key member of our leadership team, will be a tremendous asset as we ramp and support multiple leading-edge process control positions within nearly every major semiconductor fab around the globe."

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About Nanometrics Incorporated
Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, such as data storage components and discretes including high-brightness LEDs and power management components. Nanometrics' automated and integrated metrology systems measure critical dimensions, device structures, overlay registration, topography and various thin film properties, including film thickness as well as optical, electrical and material properties. The company's process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics' systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor market. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO.

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Contacts:
Claire McAdams
Headgate Partners LLC
530.265.9899

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