Home > Press > High-precision positioning of wafers in inspection systems
 |
Abstract:
The current standard wafer has a diameter of 8". The industry is moving towards manufacturing larger wafers. Technologies for production processes such as stealth dicing, lithography, doping, implanting, planarization makes precise positioning of the bigger substrates a must. Thin film technology places great demands on the substrates and their structures. The piezosystem jena GmbH now offers a positioning system for the inspection of the new larger wafers.
High-precision positioning of wafers in inspection systems
Jena, Germany | Posted on July 8th, 2014The new system offered by piezosystem jena system is designed to position wafers with a diameter up to 12" using precise hold and repeat positioning with the same precise precision. The system can be used as an automated inline controller or as a stand-alone positioner. The highly precise positioning system allows steady processes in production and process control. The new system will also shorten cycle times in quality control. Piezosystem jena's new system offers positioning in microseconds with steps of a few microns with repeatability in nanometers. Your crucial data will be obtained quickly with excellent performance and value.
Requirements:
•measuring range < 300 µm
•small, repeatable steps
•movement free of displacement
•short rise time
•controlled positioning
Applications:
•semi conductor and solar producing
•lithography
•display production
•surface structuring
•surface inspection
•measurement chips
•measurement of conductor tracks
•measurement systems
•quality control
•bonding-technology
####
For more information, please click here
Contacts:
Theresa Kuntze
Copyright © Piezosystem Jena GmbH
If you have a comment, please Contact us.Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
Bookmark:
| Related News Press |
News and information
Sensors innovations for smart lithium-based batteries: advancements, opportunities, and potential challenges August 8th, 2025
Deciphering local microstrain-induced optimization of asymmetric Fe single atomic sites for efficient oxygen reduction August 8th, 2025
Lab to industry: InSe wafer-scale breakthrough for future electronics August 8th, 2025
Chip Technology
Lab to industry: InSe wafer-scale breakthrough for future electronics August 8th, 2025
A 1960s idea inspires NBI researchers to study hitherto inaccessible quantum states June 6th, 2025
Programmable electron-induced color router array May 14th, 2025
Enhancing power factor of p- and n-type single-walled carbon nanotubes April 25th, 2025
Announcements
Sensors innovations for smart lithium-based batteries: advancements, opportunities, and potential challenges August 8th, 2025
Deciphering local microstrain-induced optimization of asymmetric Fe single atomic sites for efficient oxygen reduction August 8th, 2025
Japan launches fully domestically produced quantum computer: Expo visitors to experience quantum computing firsthand August 8th, 2025
ICFO researchers overcome long-standing bottleneck in single photon detection with twisted 2D materials August 8th, 2025
Tools
Japan launches fully domestically produced quantum computer: Expo visitors to experience quantum computing firsthand August 8th, 2025
Rice researchers harness gravity to create low-cost device for rapid cell analysis February 28th, 2025
New 2D multifractal tools delve into Pollock's expressionism January 17th, 2025
 |
||
 |
||
| The latest news from around the world, FREE | ||
 |
||
|
|
||
| Premium Products | ||
 |
||
|
Only the news you want to read!
Learn More |
||
 |
||
|
Full-service, expert consulting
Learn More |
||
|
|
||