Nanotechnology Now - Press Release: New Extended Pressure SEM from JEOL

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Abstract:
JEOL introduces a new Scanning Electron Microscope with expanded pressure range, large specimen chamber, and unsurpassed resolution for imaging and characterizing a wide variety of sample types and sizes. The JSM-IT300LV is the latest addition to JEOL's popular series of tungsten low vacuum SEMs. This all-new design builds upon the award-winning platform of the company's InTouchScope™, analytical SEM with intuitive touch screen control, and the widely used high-performance analytical SEM, the JSM-6610LV.

New Extended Pressure SEM from JEOL

Peabody, MA | Posted on September 5th, 2013

The new JSM-IT300LV extends vacuum pressure range to 10-650pA - more than twice that of earlier models. In low vacuum mode, this capability enhances SEM imaging versatility for samples that are wet, oily, outgas excessively or are non-conductive without pretreatment.

A highly customizable SEM, the JSM-IT300LV features multiple ports for analytical attachments such as: energy dispersive X-ray spectrometer (EDS), electron backscatter diffraction (EBSD), cathodoluminescence detectors (CL), wavelength dispersive X-ray spectrometer (WDS), chamberscopes, heating/cooling substages etc.

The large vacuum chamber accommodates samples up to 300mm in diameter and 80mm in height. When maintaining sample integrity is important, this feature makes it possible to image samples as large as a tennis shoe, automobile part, or full sized silicon wafer without alteration. A variety of sample holders are available for every type of sample including special requirements.

JEOL SEMs are designed for the ultimate user experience and ease of use, and now the choice of multi-touch screen operation as well as keyboard/mouse and knob control will suit a wide variety of users. Sample navigation control, an embedded CCD camera, and 5-axis stage control with even faster asynchronous movement make it possible to image and analyze samples at a wide range of angles and orientations with pinpoint accuracy and location.

Versatility and amazing clarity in imaging across the magnification range of 5X - 300,000X are the hallmarks of the JEOL tungsten SEM family, and the JSM-IT300LV brings that capability to its highest level of performance today.

For more information on the JSM-iT300LV SEM, please visit our web page: www.jeolusa.com/PRODUCTS/ElectronOptics/ScanningElectronMicroscopes(SEM)/HVLVTungstenLaB6SEMs/JSMIT300LV/tabid/1243/Default.aspx

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