Nanotechnology Now - Press Release: Phenom proX desktop SEM enhanced with integrated Elemental Mapping and Line Scan, increasing functionality and saving time

Home > Press > Phenom proX desktop SEM enhanced with integrated Elemental Mapping and Line Scan, increasing functionality and saving time

Line Scan analysis

Abstract:
Phenom-World's proX desktop SEM will deliver more detailed information in an even faster way. The leading supplier of desktop scanning electron microscopes extends its integrated Element Identification software package with a comprehensive Elemental Mapping and Line Scan option.

Phenom proX desktop SEM enhanced with integrated Elemental Mapping and Line Scan, increasing functionality and saving time

Eindhoven, The Netherlands | Posted on April 15th, 2013

All-in-one system

All Phenom-World scanning electron microscopes are intuitive to use, compact, fast to create results and built to high quality standards. The most extended solution in the range is the Phenom proX. The advanced system identifies different elements in a specimen by using the integrated Element Identification software and specially designed EDS detector.

Fully integrated EID software and EDS detector

The EID technique analyzes X-rays generated in the specimen by the bombardment of electrons from an advanced CeB6 electron source. The EID software package is fully integrated, so there is no need to switch between software packages or computers. The software allows users to identify any hidden elements within a sample via the point-and-shoot functionality. Additionally, the software can be expanded with a combined Elemental Mapping and Line Scan option.

Elemental Mapping & Line Scan with many individual choices

Elemental Mapping reveals the distribution of elements within the sample. The selected elements can be mapped at a user-specified pixel resolution and acquisition time. Elements can be added or removed at any time during or after the mapping process. Mapping can be done on the image as a whole, but there is an additional benefit included to save time by adding the Selected Area option. Line Scan allows analysis over a selected line. The key lies in the possibility to select each of the following: number of points, dwell time per point and number of passes. On top of that, the results can be easily exported and reported via an automated template.

"Our dedicated development team has again succeeded in transforming a complex analysis technique into an intuitive and easy-to-use application. It fits our Phenom philosophy perfectly, so both new as well as experienced users can find their way in just minutes." (Willem Theuws, R&D Director Phenom-World)

More for your investment

The Phenom proX desktop SEM is offered as a complete package: imaging module with EDX detector, 19" touch screen monitor, rotary knob, mouse, diaphragm vacuum pump, power supply, USB flash drive, Pro Suite 19" monitor, mini-PC, keyboard, pre-installed Pro Suite software and the applications Remote UI and Element Identification.

####

About Phenom-World
Phenom-World is a leading global supplier of desktop scanning electron microscopes and imaging solutions for sub-micron scale applications. Our SEM-based systems are used in a broad range of markets and applications.

We continuously invest, develop and integrate our products to help our customers improve their return on investment, time to data, and increase system functionality.

We help our customers with excellent and fast results from the micro and nano world by ensuring worry-free imaging and analysis.

For more information, please click here

Contacts:
Dillenburgstraat 9E
5652 AM Eindhoven The Netherlands
Phone: +31 (0)40 259 7360
Fax: +31 (0)40 259 7370

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark: