Home > Press > Nanometrics Announces Participation in the Piper Jaffray TMT Conference
Abstract:
Nanometrics Incorporated (Nasdaq: NANO), a leading provider of advanced process control metrology systems used primarily in the fabrication of semiconductors, high-brightness LEDs, data storage devices and solar photovoltaics, will participate in the Piper Jaffray Technology, Media & Telecommunications Conference taking place in New York November 9th and 10th.
Mr. Jim Moniz, chief financial officer, will participate in a semiconductor capital equipment panel discussion at 8:30am ET on Wednesday, November 10th. The panel discussion will not be webcast; however, an updated copy of the company's investor presentation will be made available on the investor page of Nanometrics' website, www.nanometrics.com.
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About Nanometrics
Nanometrics is a leading provider of advanced, high-performance process control metrology systems used primarily in the fabrication of semiconductors, high-brightness LEDs, data storage devices and solar photovoltaics. Nanometrics’ automated and integrated metrology systems measure critical dimensions, device structures, overlay registration, topography and various thin film properties, including film thickness as well as optical, electrical and material properties. The company’s process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics’ systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Market under the symbol NANO. Nanometrics’ website is www.nanometrics.com.
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Contacts:
Company Contact:
Jim Moniz, CFO
408-545-6145 tel; 408-521-9370 fax
Investor Relations Contact:
Claire McAdams
Headgate Partners LLC
530-265-9899 tel; 530-265-9699 fax
Copyright © Nanometrics
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