Home > Press > Nanometrics to Present at the Kaufman Brothers 13th Annual Investor Conference
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Nanometrics Incorporated (NANO 12.95, -0.28, -2.12%), a leading provider of advanced process control metrology systems used primarily in the fabrication of semiconductors, high-brightness LEDs, data storage devices and solar photovoltaics, today announced that Jim Moniz, chief financial officer, will participate in the Kaufman Brothers 13th Annual Investor Conference taking place next week in New York.
The presentation will take place on Wednesday, September 15th, 2010 at 3:00pm EDT. A live and archived webcast, as well as a copy of the presentation slides, will be made available on the investor page of Nanometrics' website, www.nanometrics.com.
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About Nanometrics
Nanometrics is a leading provider of advanced, high-performance process control metrology systems used primarily in the fabrication of semiconductors, high-brightness LEDs, data storage devices and solar photovoltaics. Nanometrics' automated and integrated metrology systems measure critical dimensions, device structures, overlay registration, topography and various thin film properties, including film thickness as well as optical, electrical and material properties. The company's process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics' systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Market under the symbol NANO.
For more information, please click here
Contacts:
Headgate Partners LLC
Claire McAdams, 530-265-9899 (Investor Relations)
Fax: 530-265-9699
claire@headgatepartners.com
or
Nanometrics Incorporated
James Moniz, CFO, 408-545-6145
Fax: 408-521-9370
jmoniz@nanometrics.com
Copyright © Nanometrics
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