Home > News > Innovative Nanotechnology for Contact-Free Surface Measurement
March 23rd, 2009
Innovative Nanotechnology for Contact-Free Surface Measurement
Abstract:
At Control 2009, Leica Microsystems is presenting a new technology for contact-free 3D surface measurement that resolves structures smaller than one nanometer. The DCM 3D is suitable for a wide variety of measurement applications in R&D and quality assurance laboratories all the way to online process control. The system is extremely useful for the quality control of solar cells, for example.
Source:
measurementdevices.com
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