April 17th, 2007
LISE System
Abstract:
Fogale Nanotech presents the fiber-optic LISE (low-coherence interferometric sensor) as a metrology tool for optics manufacturing.
Applications include the center-thickness measurement of single optical components, and the "global"' on-axis metrology of completely mounted optical systems where all lens thicknesses and airgaps along the optical axis are measured without touching or disassembling the optical system.
Source:
photonics.com
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