Home > News > Nanometer ICs have stringent testing requirements
October 25th, 2006
Nanometer ICs have stringent testing requirements
Abstract:
As the EDA industry focuses on design-for-manufacturability (DFM), the older problem of design-for-test has almost been forgotten. But ICs built at 90 nanometers and below pose new and troubling challenges for DFT tools and techniques, according to providers who will take part in this week's International Test Conference here.
Source:
EETimes
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