Home > News > FEI Launches New V600FIB System
July 6th, 2006
FEI Launches New V600FIB System
Abstract:
FEI Company (Nasdaq: FEIC) has released the V600FIB, an all-new focused ion beam (FIB) system designed to provide optimum flexibility for high-throughput applications including circuit modification, cross-sectioning, sample prep and failure analysis for semiconductor devices with designs down to 90 nm.
Source:
prnewswire
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