Home > News > Powerful New Semiconductor Defect Analysis Solution
December 13th, 2005
Powerful New Semiconductor Defect Analysis Solution
Abstract:
FEI Company (Nasdaq: FEIC), the industry leader in Tools for Nanotech(TM), and PDF Solutions, Inc., the leading provider of semiconductor process-design integration technologies and services, jointly announced the successful integration of PDF Solutions Characterization Vehicle(R) (CV) infrastructure (CVi) and FEI's Defect Analyzer (DA) 300HP next-generation DualBeam(TM) system for automated in-fab defect analysis.
Source:
prnewswire
Bookmark:
| Related News Press |
Chip Technology
Nanofibrous metal oxide semiconductor for sensory face November 8th, 2024
New discovery aims to improve the design of microelectronic devices September 13th, 2024
Groundbreaking precision in single-molecule optoelectronics August 16th, 2024
Announcements
Nanotechnology: Flexible biosensors with modular design November 8th, 2024
Exosomes: A potential biomarker and therapeutic target in diabetic cardiomyopathy November 8th, 2024
Turning up the signal November 8th, 2024
Nanofibrous metal oxide semiconductor for sensory face November 8th, 2024
Tools
Turning up the signal November 8th, 2024
Quantum researchers cause controlled ‘wobble’ in the nucleus of a single atom September 13th, 2024
Faster than one pixel at a time – new imaging method for neutral atomic beam microscopes developed by Swansea researchers August 16th, 2024
 |
||
 |
||
| The latest news from around the world, FREE | ||
 |
||
|
|
||
| Premium Products | ||
 |
||
|
Only the news you want to read!
Learn More |
||
 |
||
|
Full-service, expert consulting
Learn More |
||
|
|
||