Home > Press > MikroMasch® Introducing OPUS™ AFM Tips, featuring Tip Visibility
Abstract:
MikroMasch™ have introduced a new line of AFM tips – OPUS™.
MikroMasch® Introducing OPUS™ AFM Tips, featuring Tip Visibility
Sofia, Bulgaria | Posted on December 9th, 2015The key feature of OPUS™ is AFM tip visibility: OPUS™ AFM tips are positioned exactly at the end of each cantilever at an angle of 90 degrees, which enables a precise tip positioning on the sample to be measured.
OPUS™ tips are available on all standard cantilever types for all commonly used AFM applications, including high speed scanning. OPUS™ AFM probes also offer all major coatings that are being used in AFM.
Other important features of OPUS™ AFM probes are:
• Tip sharpness better than 7 nm
• High Q-factor and smooth resonance curves
• A highly competitive pricing
Evaluation samples will be provided free of charge to interested AFM users.
For more information visit www.opustips.com.
To request an evaluation sample please follow this link: www.opustips.com/en/contacts.html
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For more information, please click here
Contacts:
Nikoleta Tsvetkova
MikroMasch™, operated by
Innovative Solutions Bulgaria Ltd.
48, Joliot Curie St.
1113 Sofia
Bulgaria
Tel: +359 2 8658629
Fax: +359 2 9630732
Copyright © Innovative Solutions Bulgaria Ltd.
If you have a comment, please Contact us.Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
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