Nanotechnology Now - Press Release: Inventor of AFM-IR technique to receive the prestigious Ernst Abbe Memorial Award for pioneering field of nanoscale IR Spectroscopy

Home > Press > Inventor of AFM-IR technique to receive the prestigious Ernst Abbe Memorial Award for pioneering field of nanoscale IR Spectroscopy

Abstract:
- Anasys Instruments is pleased to announce that the inventor of the AFM-IR technique, Professor Alexandre Dazzi from the Université Paris-Sud, is to receive the Ernst Abbe Memorial Award. The award is given by the New York Microscopy Society and will be presented at the 2014 Eastern Analytical Symposium and Exhibition being held November 17-19, Somerset, New Jersey, USA.

Inventor of AFM-IR technique to receive the prestigious Ernst Abbe Memorial Award for pioneering field of nanoscale IR Spectroscopy

Santa Barbara, CA | Posted on March 18th, 2014

Professor Alexandre Dazzi, from the Laboratoire de Chimie Physique at the Université Paris-Sud has been selected to receive the New York Microscopy Society's Ernst Abbe Award. Since its inception in 1973, 24 scientists have been recognized including innovators such as Albert V. Crewe (inventor of Scanning Electron Transmission Microscopy), Edwin H. Land (inventor of Polaroid photography), Gerd Binning & Heinrich Rohrer (inventors of AFM). The Society presents this award to acknowledge the recipient's outstanding contributions to imaging science and microscopy.

The Abbe Award will be presented to Professor Dazzi at a special Abbe Award Symposium within the 17-19 November 2014 Eastern Analytical Symposium and Exhibition (EAS). As the Abbe awardee, Professor Dazzi will present a paper on his work within the Abbe Award Symposium chaired by John A. Reffner, Professor of Forensic Science at John Jay College, CUNY.

Professor Dazzi's work has been commercialized by Anasys Instruments in Santa Barbara, California with a product called nanoIR™. Now, in its second generation, the nanoIR2™ is a nanoscale material property measurement platform that combines atomic force microscopy (AFM) with IR spectroscopy, thermal and mechanical analysis. Dr, Craig Prater, CTO of Anasys, added that "We are delighted that Alex's groundbreaking innovation is being recognized by this prestigious honor. We frequently hear from customers and collaborators that AFM-IR allows them to perform measurements they can't achieve with any other technique."

####

About Anasys Instruments
Anasys Instruments designs breakthrough, award-winning products that deliver probe-based analytical techniques while providing high quality AFM imaging. We pioneered nanoscale IR spectroscopy, nanoscale thermal analysis and wideband nanoscale dynamic mechanical spectroscopy.

For more information, please click here

Contacts:
Anasys contact:
Roshan Shetty
Anasys Instruments Corporation
325 Chapala Street
Santa Barbara
CA 93101 USA
Tel: +1 (805) 730-3310
http://www.anasysinstruments.com/

Media contact:
Jezz Leckenby
Talking Science Limited
39 de Bohun Court
Saffron Walden
Essex CB10 2BA, UK
Tel +44 (0) 1799 521881
Mob +44 (0) 7843 012997
http://www.talking-science.com/