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Abstract:
NanoWorld AG announced that it has launched a website entirely dedicated to High Speed Scanning Atomic Force Microscopy (HS-AFM) at www.highspeedscanning.com.

NanoWorld AG announces High Speed Scanning AFM website

Neuchatel, Switzerland | Posted on May 30th, 2011

NanoWorld AG announced that it has launched a website entirely dedicated to High Speed Scanning Atomic Force Microscopy (HS-AFM) at www.highspeedscanning.com. NanoWorld dedicates this website to the community of high speed scanning AFM users and focuses on the probe aspect of high speed
For a long time Fast Scanning in Scanning Probe Microscopy was limited by two factors: no commercial High Speed Scanning Probe Microscopes (SPM) and Atomic Force Microscopes (AFM) were available and there were hardly any dedicated High Speed scanning probes available.

On the instrumentation side the first systems have recently been commercialized.

To achieve the best results with these high speed scanning microscopes specially designed high speed scanning probes need to be used that differ from standard AFM probes.

The NanoWorld R&D team is developing AFM probes for fast scanning since many years.
The first commercially available high speed scanning probe, the Arrow UHF, was already introduced in 2004.

Meanwhile a second generation of probes dedicated to High Speed AFM has been developed in collaboration with nanotools GmbH . The prototypes of these developments are currently undergoing an extensive beta testing phase and are expected to be officially introduced soon.

The new website www.highspeedscanning.com presents information about scanning probe solutions for High Speed Scanning ranging from already commercialized probes such as the Arrow UHF to newly developed Ultra-Short Cantilevers (USC). Visitors to the website will also find an increasing number of High Speed AFM images and videos generously provided by beta-testers and researchers worldwide.

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About NanoWorld AG
Swiss-based NanoWorld AG (www.nanoworld.com) is a leading manufacturer of high quality tips for Scanning Probe Microscopy (SPM) and Atomic Force Microscopy (AFM). The Atomic Force Microscope (AFM) is the vital instrument for the whole field of nanoscience and nanotechnology. It enables its user coming from research and commercial nanotechnology businesses to investigate materials on an atomic scale. Scanning probes for Atomic Force Microscopy produced by NanoWorld AG are the key consumable, the "finger" that enables the scientist to scan surfaces point-by-point on an atomic scale. The consistent high quality of the scanning probes is vital for reproducible results.

Using NanoWorld's expertise as well as our high precision AFM Probes, our clients are able to get the best results they need for atomic force microscopy (AFM).

About nanotools GmbH
Established 1997 at the Center for NanoScience/Munich, nanotools designs, manufactures and markets tools for nanotechnology applications. nanotools core competencies are electron beam induced processing (EBD), enabling the very controlled deposition of High-Dense, amorphous Diamond like Carbon (HDC) three dimensional features.

The product line includes high aspect ratio and enhanced resolution AFM probes, as well as OEM production for various nano-micro applications. The products are customized for industrial needs, in particular for the semiconductor and high tech industry, and are used by leading fabs worldwide for inline process control. nanotools is ISO 9001 certified.

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Contacts:
Michaela Roessger
Phone: 0041-32-720-5325
Fax: 0041-32-720-5775

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