Home > Press > Colorimetry and Intensity Mapping of Large Displays With Microscopic Spatial Resolution -A Novel Solution from CRAIC Technologies
![]() |
Abstract:
The 20/20 XL™ is able to take spectra and images of microscopic features of large flat panel displays. With the ability to measure micron-sized features, the 20/20 XL™ is able to measure color and intensity of even individual pixels. This makes high spatial resolution color and intensity mapping possible for the largest displays.
CRAIC Technologies, the world's leading innovator of UV-visible-NIR microspectroscopy solutions, is proud to introduce the 20/20 XL™ UV-visible-NIR microspectrophotometer. The 20/20 XL™ microspectrophotometer is designed to non-destructively analyze microscopic features of very large displays by being capable of incorporating large scale sample handling. With a spectral range from the deep ultraviolet to the near infrared, analysis of samples can be done by absorbance, reflectance, luminescence and fluorescence with unparalleled speed and accuracy. The system can also be configured to image microscopic samples in the UV and NIR regions in addition to color imaging. Due to its flexible design which gives it the ability to analyze the largest displays, applications are numerous and include mapping color and intensity variations, film thickness measurements, and even scanning the surfaces of display components for defects. With the ability to spectral analyze and image microscopic features of very large devices, the 20/20 XL™ microspectrophotometer is the cutting-edge micro-analysis tool for laboratories and manufacturing facilities.
"CRAIC Technologies has been an innovator in the field of UV-visible-NIR microanalysis since its founding. We have helped to advance the field of microscale analysis with innovative instrumentation, software, research and teaching. The 20/20 XL™ microspectrophotometer was born out of demand from our industrial customers to be able to analyze microscopic features of very large displays" states Dr. Paul Martin, President of CRAIC Technologies. "As such, we have listened to our customers and created the 20/20 XL™, a system backed by years of experience in designing, building and the using of this type of instrumentation for spectroscopic and image analysis."
The 20/20 XL™ microspectrophotometer integrates an advanced spectrophotometer with a sophisticated UV-visible-NIR range microscope and powerful, easy-to-use software. This flexible instrument is designed to attach to large sample handling frames so that even the largest displays may be analyzed. It is able to acquire data from microscopic features of very large samples by absorbance, reflectance or even luminescence spectroscopy, in addition to microcolorimetry, film thickness measurements and even imaging in the UV, visible and NIR regions. Touch screen controls, sophisticated software, calibrated variable apertures and other innovations all point to a new level of sophistication for microanalysis. With high sensitivity, durable design, ease-of-use, multiple imaging and spectroscopic techniques, automation and the support of CRAIC Technologies, the 20/20 XL™ is more than just a quality control measurement tool…it is the solution to your analytical challenges.
####
About CRAIC Technologies, Inc.
CRAIC Technologies, Inc. is a global technology leader focused on innovations for microscopy and microspectroscopy in the ultraviolet, visible and near-infrared regions. CRAIC Technologies creates cutting-edge solutions, with the very best in customer support, by listening to our customers and implementing solutions that integrate operational excellence and technology expertise. CRAIC Technologies provides answers for customers in forensic sciences, biotechnology, semiconductor, geology, nanotechnology and materials science markets who demand quality, accuracy, precision, speed and the best in customer support.
For more information, please click here
Contacts:
CRAIC Technologies, Inc.
+1-310-573-8180
Copyright © CRAIC Technologies, Inc.
If you have a comment, please Contact us.Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.
Related News Press |
News and information
Sensors innovations for smart lithium-based batteries: advancements, opportunities, and potential challenges August 8th, 2025
Deciphering local microstrain-induced optimization of asymmetric Fe single atomic sites for efficient oxygen reduction August 8th, 2025
Lab to industry: InSe wafer-scale breakthrough for future electronics August 8th, 2025
Imaging
ICFO researchers overcome long-standing bottleneck in single photon detection with twisted 2D materials August 8th, 2025
Simple algorithm paired with standard imaging tool could predict failure in lithium metal batteries August 8th, 2025
First real-time observation of two-dimensional melting process: Researchers at Mainz University unveil new insights into magnetic vortex structures August 8th, 2025
Announcements
Sensors innovations for smart lithium-based batteries: advancements, opportunities, and potential challenges August 8th, 2025
Deciphering local microstrain-induced optimization of asymmetric Fe single atomic sites for efficient oxygen reduction August 8th, 2025
Japan launches fully domestically produced quantum computer: Expo visitors to experience quantum computing firsthand August 8th, 2025
ICFO researchers overcome long-standing bottleneck in single photon detection with twisted 2D materials August 8th, 2025
Tools
Japan launches fully domestically produced quantum computer: Expo visitors to experience quantum computing firsthand August 8th, 2025
Rice researchers harness gravity to create low-cost device for rapid cell analysis February 28th, 2025
New 2D multifractal tools delve into Pollock's expressionism January 17th, 2025
Photonics/Optics/Lasers
ICFO researchers overcome long-standing bottleneck in single photon detection with twisted 2D materials August 8th, 2025
Institute for Nanoscience hosts annual proposal planning meeting May 16th, 2025
![]() |
||
![]() |
||
The latest news from around the world, FREE | ||
![]() |
![]() |
||
Premium Products | ||
![]() |
||
Only the news you want to read!
Learn More |
||
![]() |
||
Full-service, expert consulting
Learn More |
||
![]() |