Nanotechnology Now

Our NanoNews Digest Sponsors
Heifer International



Home > Press > Getting the Point: Real-Time Monitoring of Atomic-Microscope Probes Adjusts for Wear

As an atomic force microscope’s tip degrades, the change in tip size and shape affects its resonant frequency and that can be used to accurately measure, in real time, the change in the tip’s shape, thereby resulting in more accurate measurements and images at nanometer size scales.
Credit: Jason Killgore, NIST
As an atomic force microscope’s tip degrades, the change in tip size and shape affects its resonant frequency and that can be used to accurately measure, in real time, the change in the tip’s shape, thereby resulting in more accurate measurements and images at nanometer size scales.
Credit: Jason Killgore, NIST

Abstract:
Scientists at the National Institute of Standards and Technology (NIST) have developed a way to measure the wear and degradation of the microscopic probes used to study nanoscale structures in situ and as it's happening. Their technique can both dramatically speed up and improve the accuracy of the most precise and delicate nanoscale measurements done with atomic force microscopy (AFM).

Getting the Point: Real-Time Monitoring of Atomic-Microscope Probes Adjusts for Wear

Gaithersburg, MD | Posted on March 31st, 2011

If you're trying to measure the contours of a surface with a ruler that's crumbling away as you work, then you at least need to know how fast and to what extent it is being worn away during the measurement.

This has been the challenge for researchers and manufacturers trying to create images of the surfaces of nanomaterials and nanostructures. Taking a photo is impossible at such small scales, so researchers use atomic force microscopes. Think of a device like a phonograph needle being used, on a nanoscale, to measure the peaks and valleys as it's dragged back and forth across a surface. These devices are used extensively in nanoscale imaging to measure the contours of nanostructures, but the AFM tips are so small that they tend to wear down as they traverse the surface being measured.

Today, most researchers stop the measurement to "take a picture" of the tip with an electron microscope, a time-consuming method prone to inaccuracies.

NIST materials engineer Jason Killgore has developed a method for measuring in real time the extent to which AFM tips wear down. Killgore measures the resonant frequency of the AFM sensor tip, a natural vibration rate like that of a tuning fork, while the instrument is in use. Because changes to the size and shape of the tip affect its resonant frequency, he is able to measure the size of the AFM's tip as it works—in increments of a tenth of a nanometer, essentially atomic scale resolution. The technique, called contact resonance force microscopy, is described in a paper recently published in the journal Small.*

The potential impact of this development is considerable. Thousands of AFMs are in use at universities, manufacturing plants and research and development facilities around the world. Improving their ability to measure and image nanosized devices will improve the quality and effectiveness of those devices. Another benefit is that developing new measurement tips—and studying the properties of new materials used in those tips—will be much easier and faster, given the immediate feedback about wear rates.

* J. P. Killgore, R. H. Geiss and D. C. Hurley. Continuous measurement of AFM tip wear by contact resonance force microscopy. Small. Published March 15, 2011.

####

For more information, please click here

Contacts:
James Burrus

303-497-4789

Copyright © NIST

If you have a comment, please Contact us.

Issuers of news releases, not 7th Wave, Inc. or Nanotechnology Now, are solely responsible for the accuracy of the content.

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

News and information

New class of protein misfolding simulated in high definition: Evidence for recently identified and long-lasting type of protein misfolding bolstered by atomic-scale simulations and new experiments August 8th, 2025

Sensors innovations for smart lithium-based batteries: advancements, opportunities, and potential challenges August 8th, 2025

Deciphering local microstrain-induced optimization of asymmetric Fe single atomic sites for efficient oxygen reduction August 8th, 2025

Lab to industry: InSe wafer-scale breakthrough for future electronics August 8th, 2025

Imaging

ICFO researchers overcome long-standing bottleneck in single photon detection with twisted 2D materials August 8th, 2025

Simple algorithm paired with standard imaging tool could predict failure in lithium metal batteries August 8th, 2025

First real-time observation of two-dimensional melting process: Researchers at Mainz University unveil new insights into magnetic vortex structures August 8th, 2025

Discoveries

Deciphering local microstrain-induced optimization of asymmetric Fe single atomic sites for efficient oxygen reduction August 8th, 2025

ICFO researchers overcome long-standing bottleneck in single photon detection with twisted 2D materials August 8th, 2025

New molecular technology targets tumors and simultaneously silences two ‘undruggable’ cancer genes August 8th, 2025

Simple algorithm paired with standard imaging tool could predict failure in lithium metal batteries August 8th, 2025

Announcements

Sensors innovations for smart lithium-based batteries: advancements, opportunities, and potential challenges August 8th, 2025

Deciphering local microstrain-induced optimization of asymmetric Fe single atomic sites for efficient oxygen reduction August 8th, 2025

Japan launches fully domestically produced quantum computer: Expo visitors to experience quantum computing firsthand August 8th, 2025

ICFO researchers overcome long-standing bottleneck in single photon detection with twisted 2D materials August 8th, 2025

Tools

Japan launches fully domestically produced quantum computer: Expo visitors to experience quantum computing firsthand August 8th, 2025

Portable Raman analyzer detects hydrogen leaks from a distance: Device senses tiny concentration changes of hydrogen in ambient air, offering a dependable way to detect and locate leaks in pipelines and industrial systems April 25th, 2025

Rice researchers harness gravity to create low-cost device for rapid cell analysis February 28th, 2025

New 2D multifractal tools delve into Pollock's expressionism January 17th, 2025

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books




NNN

The Hunger Project