Home > News > X-ray Diffractometer Employs Cross Beam Optics
October 15th, 2007
X-ray Diffractometer Employs Cross Beam Optics
Abstract:
The Ultima IV X-ray diffractometer is an advanced general purpose X-ray diffraction instrument for materials science, semiconductor and nanotechnology research and development, as well as quality assurance for the manufacturing environment. Features include a high speed detector for 100× faster measurements, application flexibility provided by Cross Beam Optics (CBO), and a 50% smaller size than a conventional XRD system.
Source:
analyticallaboratoryexpo.com
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