Home > News > Keithley Announces Joint Development Partnership With France’s CEA Leti Laboratory To Pursue Advanced Nanotechnology And Semiconductor Materials Resea
August 13th, 2007
Abstract:
Keithley Instruments, Inc. a leader in solutions for emerging measurement needs, announced that it has entered into a Joint Development Partnership (JDP) surrounding semiconductor device material testing technology with CEA Leti, one of the world's most sophisticated semiconductor development laboratories. The JDP calls for Keithley and CEA Leti to research methods for characterizing advanced semiconductor materials and devices that support DC, high frequency, and RF-level signals on both micro- and nano-level structures. CEA Leti will use Keithley RF-enabled semiconductor test equipment as part of its broad portfolio of research projects in order to expand and enhance understanding of the performance of semiconductor devices that perform at the highest levels.
Source:
laboratorynetwork.com
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