Home > News > Metrology for nanotechnology
April 2nd, 2007
Metrology for nanotechnology
Abstract:
A workshop on metrology for nanotechnology will take place on 14 and 15 June in Turin, Italy.
The event will be application-oriented, and will incorporate real industrial experiences and needs. It will bring together industrial users and experts from Italy's metrology community, as well as some international experts, to discuss needs in nanometrology and recent developments, particularly with reference to techniques and methods of measurement, instrumentation and standards.
Source:
cordis.europa.eu
Related News Press |
Announcements
Nanotechnology: Flexible biosensors with modular design November 8th, 2024
Exosomes: A potential biomarker and therapeutic target in diabetic cardiomyopathy November 8th, 2024
Turning up the signal November 8th, 2024
Nanofibrous metal oxide semiconductor for sensory face November 8th, 2024
Events/Classes
A New Blue: Mysterious origin of the ribbontail ray’s electric blue spots revealed July 5th, 2024
Researchers demonstrate co-propagation of quantum and classical signals: Study shows that quantum encryption can be implemented in existing fiber networks January 20th, 2023
The latest news from around the world, FREE | ||
Premium Products | ||
Only the news you want to read!
Learn More |
||
Full-service, expert consulting
Learn More |
||