Home > News > Metrology for nanotechnology
April 2nd, 2007
Metrology for nanotechnology
Abstract:
A workshop on metrology for nanotechnology will take place on 14 and 15 June in Turin, Italy.
The event will be application-oriented, and will incorporate real industrial experiences and needs. It will bring together industrial users and experts from Italy's metrology community, as well as some international experts, to discuss needs in nanometrology and recent developments, particularly with reference to techniques and methods of measurement, instrumentation and standards.
Source:
cordis.europa.eu
Related News Press |
Announcements
Sensors innovations for smart lithium-based batteries: advancements, opportunities, and potential challenges August 8th, 2025
Deciphering local microstrain-induced optimization of asymmetric Fe single atomic sites for efficient oxygen reduction August 8th, 2025
Japan launches fully domestically produced quantum computer: Expo visitors to experience quantum computing firsthand August 8th, 2025
ICFO researchers overcome long-standing bottleneck in single photon detection with twisted 2D materials August 8th, 2025
Events/Classes
Institute for Nanoscience hosts annual proposal planning meeting May 16th, 2025
A New Blue: Mysterious origin of the ribbontail ray’s electric blue spots revealed July 5th, 2024
Researchers demonstrate co-propagation of quantum and classical signals: Study shows that quantum encryption can be implemented in existing fiber networks January 20th, 2023
![]() |
||
![]() |
||
The latest news from around the world, FREE | ||
![]() |
![]() |
||
Premium Products | ||
![]() |
||
Only the news you want to read!
Learn More |
||
![]() |
||
Full-service, expert consulting
Learn More |
||
![]() |