Home > News > Atomic force microscope takes a closer look at individual atoms
March 2nd, 2007
Atomic force microscope takes a closer look at individual atoms
Abstract:
Hot on the heels of Purdue's Mini 10 chemical analyzer comes a (somewhat) similar creature from the other side of the globe, as Osaka University's Yoshiaki Sugimoto and colleagues have "found a way to use the atomic force microscope to produce images that reveal the chemical identity of individual atoms on a surface."
Source:
engadget.com/
Related News Press |
Interviews/Book Reviews/Essays/Reports/Podcasts/Journals/White papers/Posters
New molecular technology targets tumors and simultaneously silences two ‘undruggable’ cancer genes August 8th, 2025
Simple algorithm paired with standard imaging tool could predict failure in lithium metal batteries August 8th, 2025
First real-time observation of two-dimensional melting process: Researchers at Mainz University unveil new insights into magnetic vortex structures August 8th, 2025
Lab to industry: InSe wafer-scale breakthrough for future electronics August 8th, 2025
Tools
Japan launches fully domestically produced quantum computer: Expo visitors to experience quantum computing firsthand August 8th, 2025
Rice researchers harness gravity to create low-cost device for rapid cell analysis February 28th, 2025
New 2D multifractal tools delve into Pollock's expressionism January 17th, 2025
Human Interest/Art
New 2D multifractal tools delve into Pollock's expressionism January 17th, 2025
Drawing data in nanometer scale September 30th, 2022
Scientists prepare for the world’s smallest race: Nanocar Race II March 18th, 2022
Graphene nanotubes revolutionize touch screen use for prosthetic hands August 3rd, 2021
![]() |
||
![]() |
||
The latest news from around the world, FREE | ||
![]() |
![]() |
||
Premium Products | ||
![]() |
||
Only the news you want to read!
Learn More |
||
![]() |
||
Full-service, expert consulting
Learn More |
||
![]() |