Home > News > X-Tek Announces New features for the Revolution X-ray Inspection System and Demonstrates C.T. Capability at APEX
February 6th, 2007
X-Tek Announces New features for the Revolution X-ray Inspection System and Demonstrates C.T. Capability at APEX
Abstract:
The X-Tek Group, one of the world's leading manufacturers of real-time microfocus X-ray systems, will announce the inclusion of a new camera and detector combination for the Revolution NanoTech X-ray inspection system and a new validation station for enhanced production capability at APEX, booth 2237. Visitors to the X-Tek booth will also be able to experience a demonstration of Computerized Tomography (C.T.), a powerful new 3D imaging capability to the industry leading Revolution system.
Source:
pcb007.com
Related News Press |
Announcements
Closing the gaps — MXene-coating filters can enhance performance and reusability February 28th, 2025
Rice researchers harness gravity to create low-cost device for rapid cell analysis February 28th, 2025
Tools
Rice researchers harness gravity to create low-cost device for rapid cell analysis February 28th, 2025
New 2D multifractal tools delve into Pollock's expressionism January 17th, 2025
Turning up the signal November 8th, 2024
![]() |
||
![]() |
||
The latest news from around the world, FREE | ||
![]() |
![]() |
||
Premium Products | ||
![]() |
||
Only the news you want to read!
Learn More |
||
![]() |
||
Full-service, expert consulting
Learn More |
||
![]() |