Home > News > X-Tek Announces New features for the Revolution X-ray Inspection System and Demonstrates C.T. Capability at APEX
February 6th, 2007
X-Tek Announces New features for the Revolution X-ray Inspection System and Demonstrates C.T. Capability at APEX
Abstract:
The X-Tek Group, one of the world's leading manufacturers of real-time microfocus X-ray systems, will announce the inclusion of a new camera and detector combination for the Revolution NanoTech X-ray inspection system and a new validation station for enhanced production capability at APEX, booth 2237. Visitors to the X-Tek booth will also be able to experience a demonstration of Computerized Tomography (C.T.), a powerful new 3D imaging capability to the industry leading Revolution system.
Source:
pcb007.com
Bookmark:
| Related News Press |
Announcements
Sensors innovations for smart lithium-based batteries: advancements, opportunities, and potential challenges August 8th, 2025
Deciphering local microstrain-induced optimization of asymmetric Fe single atomic sites for efficient oxygen reduction August 8th, 2025
Japan launches fully domestically produced quantum computer: Expo visitors to experience quantum computing firsthand August 8th, 2025
ICFO researchers overcome long-standing bottleneck in single photon detection with twisted 2D materials August 8th, 2025
Tools
Japan launches fully domestically produced quantum computer: Expo visitors to experience quantum computing firsthand August 8th, 2025
Rice researchers harness gravity to create low-cost device for rapid cell analysis February 28th, 2025
New 2D multifractal tools delve into Pollock's expressionism January 17th, 2025
 |
||
 |
||
| The latest news from around the world, FREE | ||
 |
||
|
|
||
| Premium Products | ||
 |
||
|
Only the news you want to read!
Learn More |
||
 |
||
|
Full-service, expert consulting
Learn More |
||
|
|
||