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September 12th, 2006

FEI and Malvern Team for Nanoparticle Analysis

Abstract:
FEI Company (Nasdaq: FEIC) and Malvern Instruments Ltd (Malvern, UK) have entered into a joint development and marketing program for advanced nanoparticle analysis utilizing Malvern's particle image analysis software on FEI's line of Quanta(TM) scanning electron microscopes (SEMs). The combination delivers a powerful particle analysis solution that extends current analysis technologies for nano-sized particles.

Source:
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