Home > News > FEI's Titan(TM) S/TEM Achieves Low kV Milestone
July 31st, 2006
FEI's Titan(TM) S/TEM Achieves Low kV Milestone
Abstract:
FEI Company (Nasdaq: FEIC) today announced that scientists at its NanoPort(TM) in Europe have broken another image resolution barrier with the world's most advanced commercially-available microscope, the Titan(TM) 80-300 corrected S/TEM. For the first time ever, directly interpretable TEM images with atomic resolution better than 1.4 Angstrom were obtained at the very low operating voltage of 80kV.
Source:
prnewswire
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