Nanotechnology Now - News Story: Non-Contact Atomic Force Microscopy

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March 15th, 2006

Non-Contact Atomic Force Microscopy

Abstract:
The 14 April issue of Nanotechnology contains selected papers from the 8th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM) held at Bad Essen, Germany last summer.

Source:
Institute of Physics

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