Home > News > FEI's Automated 3D Cyrstallography Featured at PITTCON
March 13th, 2006
FEI's Automated 3D Cyrstallography Featured at PITTCON
Abstract:
FEI Company (Nasdaq: FEIC) will feature its EBS3 DualBeam(TM) solution for rapid serial sectioning and 3D crystallographic reconstructions of materials at this week's PITTCON conference in Orlando. The fully integrated solution, utilizes an FEI DualBeam (FIB/SEM) system with an EBSD detector and advanced automation software.
Source:
prnewswire
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