Home > News > FEI's Automated 3D Cyrstallography Featured at PITTCON
March 13th, 2006
FEI's Automated 3D Cyrstallography Featured at PITTCON
Abstract:
FEI Company (Nasdaq: FEIC) will feature its EBS3 DualBeam(TM) solution for rapid serial sectioning and 3D crystallographic reconstructions of materials at this week's PITTCON conference in Orlando. The fully integrated solution, utilizes an FEI DualBeam (FIB/SEM) system with an EBSD detector and advanced automation software.
Source:
prnewswire
Bookmark:
| Related News Press |
Announcements
Nanotechnology: Flexible biosensors with modular design November 8th, 2024
Exosomes: A potential biomarker and therapeutic target in diabetic cardiomyopathy November 8th, 2024
Turning up the signal November 8th, 2024
Nanofibrous metal oxide semiconductor for sensory face November 8th, 2024
Tools
Turning up the signal November 8th, 2024
Quantum researchers cause controlled ‘wobble’ in the nucleus of a single atom September 13th, 2024
Faster than one pixel at a time – new imaging method for neutral atomic beam microscopes developed by Swansea researchers August 16th, 2024
 |
||
 |
||
| The latest news from around the world, FREE | ||
 |
||
|
|
||
| Premium Products | ||
 |
||
|
Only the news you want to read!
Learn More |
||
 |
||
|
Full-service, expert consulting
Learn More |
||
|
|
||