Home > News > FEI's Titan(TM) S/TEM Receives Industry Honors
January 31st, 2006
FEI's Titan(TM) S/TEM Receives Industry Honors
Abstract:
Within months of its release, FEI's Titan(TM) scanning transmission electron microscope (S/TEM), the world's most powerful, commercially-available microscope, has earned four prestigious awards for its design, performance and innovation. Awards include the coveted iF Design Award bestowed by the International Design Forum (iF) in Hannover, Germany, and the Innovative Product of the Year Award presented by the Oregon Tech Awards in the United States.
Source:
prnewswire
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