Home > News > Imago Scientific Instruments: LEAP 3000 Metrology System
August 19th, 2005
Imago Scientific Instruments: LEAP 3000 Metrology System
Abstract:
This unique nano-metrology tool has proven valuable in providing solutions to challenges facing researchers in the advanced materials field such as the study of point defects related to the embrittlement process, irradiation induced precipitation, matrix damage and grain boundary segregation.
Source:
wisbusiness.com
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