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August 1st, 2005

Sub-angstrom microscope targets nanotechnology

Abstract:
FEI Co. unveiled the new device at the Microscopy & Microanalysis conference this week in Honolulu. FEI claims its commercial instrument resolves at the sub-angstrom scale for the first time. Designed for nanotechnology development, FEI’s microscope, called the Titan 80-300, enables sub-angstrom (atomic scale) imaging and analysis.

Source:
EETimes

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