Nanotechnology Now - News Story: Xradia Announces X-ray Fluorescence Imaging Tool

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July 11th, 2005

Xradia Announces X-ray Fluorescence Imaging Tool

Abstract:
X-ray microscopy company Xradia Inc. announced today the release of a new element-specific x-ray imaging tool for semiconductor metrology, Scanning Electron Microscopes and Electron Probe Micro Analyzers.

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