Home > News > Conductive tips for atomic force microscopy
May 24th, 2005
Conductive tips for atomic force microscopy
Abstract:
Researchers in Switzerland have tested an atomic force microscope with an electrically insulated conductive tip. The scientists, from the University of Basel and University of Neuchâtel, imaged the hexagonally packed intermediate layer of the red bacterium Deinococcus radiodurans.
“This is the first time that an image of better than 10 nm resolution has been generated using the Faraday current,” Andreas Engel of the University of Basel.
Source:
nanotechweb
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