Home > News > Multiscan Atomic Force Probe with Ultra Stable Platform
May 13th, 2005
Multiscan Atomic Force Probe with Ultra Stable Platform
Abstract:
The X series Nanoprober combines a rock-solid platform with the high performance Multiscan Atomic Force Probe (AFP) for high tool efficiency and lab productivity. It is for 45 nm, 65 nm, 90 nm and larger process technology measurements and PicoCurrent imaging capabilities.
Source:
labequipmag.com
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