Nanotechnology Now - News Story: Hitachi High Technologies Introduces New In-Lens FE-SEM

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May 4th, 2005

Hitachi High Technologies Introduces New In-Lens FE-SEM

Abstract:
Hitachi High Technologies America, Inc. today announced the release of its latest high-resolution in-lens Field Emission Scanning Electron Microscope (FE-SEM), the new Model S-5500.

Source:
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