Home > News > FEI Introduces Nova(TM) NanoSEM
March 1st, 2005
FEI Introduces Nova(TM) NanoSEM
Abstract:
FEI Company today released the newest member of its Nova(TM) family of SEM and DualBeam(TM) systems, the Nova NanoSEM. It is the world's first low-vacuum, field emission scanning electron microscope (FEG-SEM) solution for ultra-high resolution characterization of charging and/or contaminating samples such as organic materials, substrates, porous materials, plastics and polymers.
Source:
prnewswire
Bookmark:
| Related News Press |
Announcements
Rice membrane extracts lithium from brines with greater speed, less waste October 3rd, 2025
Researchers develop molecular qubits that communicate at telecom frequencies October 3rd, 2025
Next-generation quantum communication October 3rd, 2025
"Nanoreactor" cage uses visible light for catalytic and ultra-selective cross-cycloadditions October 3rd, 2025
Tools
Japan launches fully domestically produced quantum computer: Expo visitors to experience quantum computing firsthand August 8th, 2025
Rice researchers harness gravity to create low-cost device for rapid cell analysis February 28th, 2025
 |
||
 |
||
| The latest news from around the world, FREE | ||
 |
||
|
|
||
| Premium Products | ||
 |
||
|
Only the news you want to read!
Learn More |
||
 |
||
|
Full-service, expert consulting
Learn More |
||
|
|
||