Home > Press > Veeco Instruments SPM Conference and User's Meeting
Abstract:
Scanning Probe Microscopy informal discussion forum
Veeco Instruments Scandinavia SPM Conference and User’s Meeting 2005
February 25, 2005
Veeco designs, manufactures, markets and services a broad line of equipment primarily used to provide critical surface measurements on thin film magnetic heads and disks used in hard drives, as well as on semiconductor wafers and in research applications in the Optical Telecommunications, Data Storage and Semiconductor industries. Veeco Instruments SPM Applications and Users Conference will focus on exciting new SPM imaging modes and applications with speakers from leading Research Groups from Scandinavia with a demonstration focussing on the application of AFM, nanolithography, advanced force curves using for instance scripting and point-and-shoot. The meeting is open to anyone with an interest in Scanning Probe Microscopy and will act as an informal discussion forum.
Location: Helsinki University of Technology, Espoo, Finland
URL: www.veeco-europe.com/uk/index_events.htm
Dates: April 28 - 29, 2005
Contact:
Tanya Dempsey
+44 (0)1954 233901
tdempsey@veeco.co.uk
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