Home > News > A Simpler Design for X-Ray Detectors
September 15th, 2004
A Simpler Design for X-Ray Detectors
Abstract:
A simplified design for ultra-sensitive X-ray detectors offering more precise materials analysis has been demonstrated at the National Institute of Standards and Technology (NIST). The advance is a step toward making such devices cheaper and easier to produce. Users may eventually include the semiconductor industry, which needs better X-ray detectors to identify and distinguish between nanoscale contaminant particles on silicon wafers.
Source:
NIST
Bookmark:
| Related News Press |
Announcements
Sensors innovations for smart lithium-based batteries: advancements, opportunities, and potential challenges August 8th, 2025
Deciphering local microstrain-induced optimization of asymmetric Fe single atomic sites for efficient oxygen reduction August 8th, 2025
Japan launches fully domestically produced quantum computer: Expo visitors to experience quantum computing firsthand August 8th, 2025
ICFO researchers overcome long-standing bottleneck in single photon detection with twisted 2D materials August 8th, 2025
Tools
Japan launches fully domestically produced quantum computer: Expo visitors to experience quantum computing firsthand August 8th, 2025
Rice researchers harness gravity to create low-cost device for rapid cell analysis February 28th, 2025
New 2D multifractal tools delve into Pollock's expressionism January 17th, 2025
 |
||
 |
||
| The latest news from around the world, FREE | ||
 |
||
|
|
||
| Premium Products | ||
 |
||
|
Only the news you want to read!
Learn More |
||
 |
||
|
Full-service, expert consulting
Learn More |
||
|
|
||