Home > News > KLA-Tencor and Seiko Instruments Partner
August 31st, 2004
KLA-Tencor and Seiko Instruments Partner
Abstract:
KLA-Tencor and SII NanoTechnology (SIINT), a subsidiary of Seiko Instruments, today announced they have formed a partnership to distribute SIINT's Nanopics 2100 high-speed, high-resolution atomic force profilometer to markets outside of Japan. Under the terms of the agreement, KLA-Tencor will sell the Nanopics 2100 as a joint product in North America and Europe with the full backing of its best-in-class system characterization and applications support—enabling broader access to this innovative surface metrology solution. The Nanopics 2100 is a compact tabletop system that combines the high resolution of an atomic force microscope (AFM) with the ease of use and speed of a surface profiler to enable non-destructive, absolute measurements of surface roughness, step height and surface contour. It is used to help ensure product quality for applications in a wide variety of industries, including data storage, semiconductor, and microelectromechanical systems (MEMS), as well as polymer science, optics, biotechnology, and general industrial research.
Source:
KLA-Tencor
Bookmark:
| Related News Press |
Investments/IPO's/Splits
Daikin Industries becomes OCSiAl shareholder July 27th, 2021
INBRAIN Neuroelectronics raises over €14M to develop smart graphene-based neural implants for personalised therapies in brain disorders March 26th, 2021
180 Degree Capital Corp. Issues Second Open Letter to the Board and Shareholders of Enzo Biochem, Inc. March 26th, 2021
Announcements
Nanotechnology: Flexible biosensors with modular design November 8th, 2024
Exosomes: A potential biomarker and therapeutic target in diabetic cardiomyopathy November 8th, 2024
Turning up the signal November 8th, 2024
Nanofibrous metal oxide semiconductor for sensory face November 8th, 2024
Tools
Turning up the signal November 8th, 2024
Quantum researchers cause controlled ‘wobble’ in the nucleus of a single atom September 13th, 2024
Faster than one pixel at a time – new imaging method for neutral atomic beam microscopes developed by Swansea researchers August 16th, 2024
 |
||
 |
||
| The latest news from around the world, FREE | ||
 |
||
|
|
||
| Premium Products | ||
 |
||
|
Only the news you want to read!
Learn More |
||
 |
||
|
Full-service, expert consulting
Learn More |
||
|
|
||