Home > News > NanoWorld Introduces Hybrid-Nitride AFM Probe
August 26th, 2004
NanoWorld Introduces Hybrid-Nitride AFM Probe
Abstract:
NanoWorld today (Aug. 1st, 2004) officially introduced its new Hybrid-Nitride AFM probe for contact-mode. The Hybrid-Nitride™ probe combines silicon nitride cantilevers and tips with unique features like single holder chips for easy handling, single holder design to avoid breaking residue, rounded shoulder design to prevent mechanical contact between chip and sample and a notch design of the holder chip for clear indication of the cantilever type.
Source:
NanoWorld
Bookmark:
| Related News Press |
Announcements
Nanotechnology: Flexible biosensors with modular design November 8th, 2024
Exosomes: A potential biomarker and therapeutic target in diabetic cardiomyopathy November 8th, 2024
Turning up the signal November 8th, 2024
Nanofibrous metal oxide semiconductor for sensory face November 8th, 2024
Tools
Turning up the signal November 8th, 2024
Quantum researchers cause controlled ‘wobble’ in the nucleus of a single atom September 13th, 2024
Faster than one pixel at a time – new imaging method for neutral atomic beam microscopes developed by Swansea researchers August 16th, 2024
 |
||
 |
||
| The latest news from around the world, FREE | ||
 |
||
|
|
||
| Premium Products | ||
 |
||
|
Only the news you want to read!
Learn More |
||
 |
||
|
Full-service, expert consulting
Learn More |
||
|
|
||