Home > News > New Technique That Improves The Power Of Atomic Force Microscopy
August 17th, 2004
New Technique That Improves The Power Of Atomic Force Microscopy
Abstract:
A team of researchers have developed a method that could vastly improve the ability of atomic force microscopes to "see" the chemical composition of a sample, follow variations of the sample, as well as map its topographic structure. The advance could have significant implications for drug development by allowing scientists to monitor the effects of potential drugs on an ever-smaller scale.
Source:
spacedaily
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