Home > News > Zyvex Announces New IC Probing Application
April 2nd, 2004
Zyvex Announces New IC Probing Application
Abstract:
Zyvex Corporation today announced a breakthrough probing application for integrated circuit (IC) defect analysis. Zyvex enables rapid-response semiconductor device failure analysis at the contact level for better, faster, and cheaper IC development - features that are critical to the highly-competitive semiconductor industry.
Source:
PRNewswire
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