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February 26th, 2004
SPM for everyone
Abstract:
During the last decade, the scanning probe microscope (SPM) has developed to a point where it is now an accessible, easy-to-use nanotechnology research tool. The original scanning tunneling microscope has evolved into many new instruments, the first being the atomic force microscope (AFM), which have been used to observe nearly every physical property of a surface that it is possible to measure.
Source:
Materials Today
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