Home > News > New electron microscope enhances semiconductor analysis
December 10th, 2003
New electron microscope enhances semiconductor analysis
Abstract:
Offering improved resolution and significantly enhanced capabilities for semiconductor applications, Hitachi has introduced the HD-2300 scanning transmission electron microscope (STEM). The new instrument features a Schottky-type field emission source and has STEM resolution of 0.204 nm at an accelerating voltage of 200 kV.
Source:
electropages
Bookmark:
| Related News Press |
Tools
Japan launches fully domestically produced quantum computer: Expo visitors to experience quantum computing firsthand August 8th, 2025
Rice researchers harness gravity to create low-cost device for rapid cell analysis February 28th, 2025
New 2D multifractal tools delve into Pollock's expressionism January 17th, 2025
 |
||
 |
||
| The latest news from around the world, FREE | ||
 |
||
|
|
||
| Premium Products | ||
 |
||
|
Only the news you want to read!
Learn More |
||
 |
||
|
Full-service, expert consulting
Learn More |
||
|
|
||