Nanotechnology Now

Our NanoNews Digest Sponsors
Heifer International



Home > News > AFM indenter makes holes for nanocontacts

October 24th, 2003

AFM indenter makes holes for nanocontacts

Abstract:
Researchers in France and Belgium have used a conducting-tip atomic force microscope (CTAFM) to create nanocontacts with areas of less than 10 square nm. The scientists, from Unité Mixte de Physique CNRS/Thales, France, the University of Evry, France, and the University of Louvain-La-Neuve in Belgium, controlled the nanocontact formation by measuring the resistance between the conductive tip of the AFM and a conductive sample covered with an insulating layer.

Source:
Nanotechweb

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Tools

Gap-controlled infrared absorption spectroscopy for analysis of molecular interfaces: Low-cost spectroscopic approach precisely analyzes interfacial molecular behavior using ATR-IR and advanced data analysis October 3rd, 2025

Japan launches fully domestically produced quantum computer: Expo visitors to experience quantum computing firsthand August 8th, 2025

Portable Raman analyzer detects hydrogen leaks from a distance: Device senses tiny concentration changes of hydrogen in ambient air, offering a dependable way to detect and locate leaks in pipelines and industrial systems April 25th, 2025

Rice researchers harness gravity to create low-cost device for rapid cell analysis February 28th, 2025

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books



NNN
The Hunger Project