Home > News > Measuring invisible reflections
July 25th, 2003
Measuring invisible reflections
Abstract:
Beams with a wavelength of around 13 nanometers, like their close relatives, x-rays, can neither be reflected nor focused with conventional optical systems. One solution is to use curved mirrors that - unlike those in your bathroom - are coated with hundreds of alternating layers of different materials. Each layer reflects a small part of the radiation. Researchers at the Fraunhofer Institute for Material and Beam Technology IWS rejoiced last year when they broke the 70-percent reflectivity barrier.
Source:
* AlphaGalileo
Bookmark:
| Related News Press |
Chip Technology
Nanofibrous metal oxide semiconductor for sensory face November 8th, 2024
New discovery aims to improve the design of microelectronic devices September 13th, 2024
Groundbreaking precision in single-molecule optoelectronics August 16th, 2024
 |
||
 |
||
| The latest news from around the world, FREE | ||
 |
||
|
|
||
| Premium Products | ||
 |
||
|
Only the news you want to read!
Learn More |
||
 |
||
|
Full-service, expert consulting
Learn More |
||
|
|
||