Home > News > FEI Ships First Accura XT and SNP XT Systems
July 1st, 2003
FEI Ships First Accura XT and SNP XT Systems
Abstract:
FEI Company has shipped its first AccuraTM XT Focused Ion Beam (FIB) mask repair tool and an SNPTM XT Stylus NanoProfilometerTM to a leading semiconductor mask consortium in Europe.
Source:
FEI
Related News Press |
Tools
Turning up the signal November 8th, 2024
Quantum researchers cause controlled ‘wobble’ in the nucleus of a single atom September 13th, 2024
Faster than one pixel at a time – new imaging method for neutral atomic beam microscopes developed by Swansea researchers August 16th, 2024
The latest news from around the world, FREE | ||
Premium Products | ||
Only the news you want to read!
Learn More |
||
Full-service, expert consulting
Learn More |
||