Home > News > Ultratech rolls out metrology tool for MEMS, ICs
June 18th, 2003
Ultratech rolls out metrology tool for MEMS, ICs
Abstract:
Ultratech entered the metrology market with a tool designed for semiconductor and nanotechnology applications. The new UltraMet 100 is a metrology system designed to measure any, or every, die on a wafer, providing full-wafer validation of Ultratech's Nanotech 160 dual-side-alignment stepper. The tool is designed for chip and MEMS systems.
Source:
* SiliconStrategies
Bookmark:
| Related News Press |
Tools
Rice researchers harness gravity to create low-cost device for rapid cell analysis February 28th, 2025
New 2D multifractal tools delve into Pollock's expressionism January 17th, 2025
 |
||
 |
||
| The latest news from around the world, FREE | ||
 |
||
|
|
||
| Premium Products | ||
 |
||
|
Only the news you want to read!
Learn More |
||
 |
||
|
Full-service, expert consulting
Learn More |
||
|
|
||