Nanotechnology Now

Our NanoNews Digest Sponsors
Heifer International



Home > News > New sensor bares faults in smallest possible, most advanced circuits

May 12th, 2003

New sensor bares faults in smallest possible, most advanced circuits

Abstract:
A new scanning microscope developed at Brown University can uncover defects in the smallest and most complex integrated circuits at a resolution 1,000 times greater than current technology. The scanner removes a barrier to further shrinking of integrated circuits: As circuits get smaller, non-visual defects become harder to find.

Source:
EurekAlert

Bookmark:
Delicious Digg Newsvine Google Yahoo Reddit Magnoliacom Furl Facebook

Related News Press

Tools

Gap-controlled infrared absorption spectroscopy for analysis of molecular interfaces: Low-cost spectroscopic approach precisely analyzes interfacial molecular behavior using ATR-IR and advanced data analysis October 3rd, 2025

Japan launches fully domestically produced quantum computer: Expo visitors to experience quantum computing firsthand August 8th, 2025

Portable Raman analyzer detects hydrogen leaks from a distance: Device senses tiny concentration changes of hydrogen in ambient air, offering a dependable way to detect and locate leaks in pipelines and industrial systems April 25th, 2025

Rice researchers harness gravity to create low-cost device for rapid cell analysis February 28th, 2025

NanoNews-Digest
The latest news from around the world, FREE




  Premium Products
NanoNews-Custom
Only the news you want to read!
 Learn More
NanoStrategies
Full-service, expert consulting
 Learn More











ASP
Nanotechnology Now Featured Books



NNN
The Hunger Project